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ANSYS inc 2d ansys thermal simulations
2d Ansys Thermal Simulations, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2d+ansys+thermal+simulations/ansys+transient+thermal/10__1016_slash_j__microrel__2007__07__008-82-14-15
Average 90 stars, based on 1 article reviews
2d ansys thermal simulations - by Bioz Stars, 2026-11
90/100 stars

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Article Title: Measurement of the transient junction temperature in MOSFET devices under operating conditions
Article Snippet: The capabilities of three techniques to measure the transient average junction temperature in power MOS devices based on the electrical thermo-sensitive parameters are assessed experimentally and by compact device simulation.. The first two methods make use of the dependency of dIds/dt on the temperature, while the third one exploits the temperature dependency of the turn ON delay of the device.. 2007 Elsevier Ltd. All rights reserved.



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ANSYS inc 2d ansys thermal simulations
2d Ansys Thermal Simulations, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2d+ansys+thermal+simulations/ansys+transient+thermal/10__1016_slash_j__microrel__2007__07__008-82-14-15
Average 90 stars, based on 1 article reviews
2d ansys thermal simulations - by Bioz Stars, 2026-11
90/100 stars
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